CMOS Open Defect Detection by Supply Current Measurement under Time-Variable Electric Field Supply
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- HASHIZUME Masaki
- Faculty of Engineering, The University of Tokushima
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- ICHIMIYA Masahiro
- Faculty of Engineering, The University of Tokushima
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- YOTSUYANAGI Hiroyuki
- Faculty of Engineering, The University of Tokushima
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- TAMESADA Takeomi
- Faculty of Engineering, The University of Tokushima
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抄録
In this paper, a new test method is proposed for detecting open defects in CMOS logic ICs. The method is based on supply current of ICs generated by supplying time-variable supply voltage and electric field from the outside of the ICs. Also, test input vectors for the test method are proposed and it is shown that they can be generated more easily than functional test methods based on stuck-at fault models. The feasibility of the test is examined by some experiments. The empirical results promise us that by using the method, open defects in CMOS ICs can be detected.
収録刊行物
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- IEICE transactions on information and systems
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IEICE transactions on information and systems 85 (10), 1542-1550, 2002-10-01
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詳細情報 詳細情報について
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- CRID
- 1574231876981112832
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- NII論文ID
- 110006376584
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- NII書誌ID
- AA10826272
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- ISSN
- 09168532
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles