D-10-2 Test generation for open faults by using tests for single stuck-at faults
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- Takahashi Hiroshi
- Ehime Univ.
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- Higami Yoshinobu
- Ehime Univ.
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- Kikkawa Tooru
- Ehime Univ.
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- Shimizu Yuki
- Ehime Univ.
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- Aikyo Takashi
- Ehime Univ.
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- Takamatsu Yuzo
- Ehime Univ.
Bibliographic Information
- Other Title
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- D-10-2 縮退故障テストを利用したオープン故障のテスト生成法(D-10.ディペンダブルコンピューティング,一般講演)
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Journal
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- Proceedings of the IEICE General Conference
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Proceedings of the IEICE General Conference 2007 (1), 129-, 2007-03-07
The Institute of Electronics, Information and Communication Engineers
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Details 詳細情報について
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- CRID
- 1574231876997641216
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- NII Article ID
- 110006461586
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- NII Book ID
- AN10471452
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- Text Lang
- ja
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- Data Source
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- CiNii Articles
