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Characteristics of Annular Illumination on Half Tone Phase Shift Mask
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- Kuwahara Kazuyuki
- Electric Devices Group,Oki Electric Industry
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- Onodera Toshio
- Electric Devices Group,Oki Electric Industry
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- Ohtsuka Hirashi
- Electric Devices Group,Oki Electric Industry
Bibliographic Information
- Other Title
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- ハーフトーン位相差法における輪帯照明条件の効果
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Description
In the recent progress of optical lithography,the super resolution method has been the key technique to improve the resolution without loss of depth of focus(DOF).The half tone phase shift mask(HTM)is combined with annular illumination and effectively enhances the resolution.The effects of light transmittance of shade film of HTM and illumination conditions are analyzed to optimize this method.The transmittance of shade film and the annular condition are determined to be 5% and more than 0. 3 of sl-value as the optimum condition,respectively.These simulation results are verified in the i-line positive resist process and 2.5μm DOF is obtained for 0.3μm L, S patterns.
Journal
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- Technical report of IEICE. SDM
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Technical report of IEICE. SDM 94 (282), 1-6, 1994-10-19
The Institute of Electronics, Information and Communication Engineers
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Details 詳細情報について
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- CRID
- 1574231877181826176
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- NII Article ID
- 110003310227
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- NII Book ID
- AN10013254
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- Text Lang
- ja
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- Data Source
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- CiNii Articles