155 Examination of Design Factor for Suppression of Unevenness Exposure with regards to Focal-plane shutter
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- IMAZEKI Souichirou
- Muroran Institute of Technology
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- MATSUMOTO Hiroki
- 室蘭工業大学
Bibliographic Information
- Other Title
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- 155 フォーカルプレーンシャッターにおける露光ムラを抑制するための設計因子の検討
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Description
The shutter of camera is a device that controls exposure time for the image sensor. A focal-plain-shutter is currently mainstream model of SLR Camera. The uneven-exposure is rarely occur at the manufacturing stage in the focal-plain-shutter. The uneven-exposure is phenomenon that photographs isn't able to be exposed. The unevenness-exposure cause is vibration of the shutter-blades. The cause of vibration is the gap between the shutter blades and pins. To reveal cause of the uneven-exposure, this study focuses on the backlash of arm with drive-unit. This study uses shutter-blades model for simple experiment. The experimental apparatus can drive the shutter-blade model with slider at high speed by spring force. To reveal the behavior during transient moving, two laser-displacement-meters measure the displacement gap of shutter-blade-model and slider. The results or experiments, it become clear that center of gravity and backlash size of shutter-blades model are important parameters. Rebound amount and interval time of peak to peak decrees as the backlash is decrees.
Journal
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- Dynamics and Design Conference : D & D
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Dynamics and Design Conference : D & D 2015 "155-1"-"155-11", 2015-08-25
The Japan Society of Mechanical Engineers
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Details 詳細情報について
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- CRID
- 1574231877227044608
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- NII Article ID
- 110010051778
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- NII Book ID
- AA11901770
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- ISSN
- 13480235
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- Text Lang
- ja
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- Data Source
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- CiNii Articles