Physics-based model of quantum-mechanical wave function penetration into thin dielectric films for evaluating modern MOS capacitors

Search this article

Journal

Details 詳細情報について

  • CRID
    1574231877298575488
  • NII Article ID
    110007334438
  • NII Book ID
    AA11851344
  • Text Lang
    en
  • Data Source
    • CiNii Articles

Report a problem

Back to top