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Evaluation of Moire artifacts with stationary anti-scatter grids in amorphous selenium-based flat panel x-ray detector system
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Description
ABSTRACT In digital imaging systems, using anti-scatter grids may lead to arise moire artifacts. Recently, amorphous selenium-based (direct-conversion) flat panel X-ray detector systems were developed. An important advantage of a-Se is its high spatial resolution. However, the high resolution of a-Se potentially introduces more moire artifacts. 1 The aim of present study was to choice optimal anti-scatter grids in amorphous selenium-based flat panel X-ray system, and to demonstrate how to arise moire artifacts. We simulated the sampling proce ss in the spatial domain equivalent to the sampling aperture function in the spatial frequency domain. Moire patterns appeared with the different period and contrast. The period and the contrast of moire artifacts were varied with combinations of the sampling conditions and the strip density of anti-scatter grids. Keywords: flat panel detector, moire, anti-scatter grid, aliasing, sampling 1. INTRODUCTION Anti-scatter grids are the best choice for removal of scattere d photons during x-ray examinations and show good contrast improvement. In digital imaging systems, using anti-scatter grids may lead to arise moire artifacts.
Journal
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- SPIE Proceedings
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SPIE Proceedings 6510 651040-, 2007-03-08
SPIE
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Details 詳細情報について
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- CRID
- 1870302167766352512
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- ISSN
- 0277786X
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- Data Source
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- OpenAIRE