Measurement Of Semiconductor .Laser Linewidth Enhancement Factor Using Coherent Optical Feedback

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The linewidth enhancement factor a of a semiconductor injection laser is defined to be the ratio of the changes in the real and imaginary parts of the complex susceptibility of the laser medium due to carrier density variations. We have devised a novel method for measuring this parameter by observing the changes in the optical frequency and external quantum efficiency due to coherent optical feedback. The wavelength dependence of a close to the room-temperature gain peak was measured for GaAs/GaAlAs channeled-substrate-planar devices.

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