Development of a high-performance e-beam resist suitable for advanced mask fabrication
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説明
We developed a new positive E-beam resist, 'ERB'-900 MX for fabrication of advanced masks for the next generation. 'ERB'-900 MX is a non-chemically amplified resist based on novolak and naphthoquinonediazide. A newly designed additive and modification of the novolak resin contributed to improvement of sensitivity and resolution. There are two types of 'ERB'-900 MX, 'ERB'-900 MX(alpha) and MX(beta) whose solvents are different. Most important feature of 'ERB'-900 MX is highly sensitive. Especially, 'ERB'-900 MX(beta) showed excellent sensitivity of 3.5 (mu) C/cm 2 at 20 keV and 12 (mu) C/cm 2 at 50 keV. Stability of 'ERB'-900 MX after EB exposure was quite good. No practical change in sensitivity was observed for 12 hours in air and in vacuum. CD linearity of 'ERB'-900 MX(alpha) was around 0.75 micrometers for isolated patterns. CD bias for dry-etch process of 'ERB'-900 MX(alpha) is around 0.1micrometers which is comparable to that of 'ERB'-900 M-1. We confirmed that 'ERB'-900 MX has excellent performance suitable for fabrication of advanced masks.
収録刊行物
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- SPIE Proceedings
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SPIE Proceedings 3412 237-, 1998-09-01
SPIE
