Construction of an Optical Sum Frequency Microscope with Confocal Optics
説明
We have demonstrated confocal sum frequency (SF) microscopy. The SF intensity images were obtained when the incident beams were focused at different depths in the ZnS sample from 0 ?m to 10 ?m.
収録刊行物
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- Advances in Optical Sciences Congress
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Advances in Optical Sciences Congress JWA23-, 2009-01-01
OSA
