<title>395-nm and 790-nm femtosecond laser ablation of aluminum-doped zinc oxide</title>

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説明

We used 395-nm and 790-nm femtosecond laser pulses to deposit aluminum-doped zinc oxide films by pulsed laser deposition. Electrical resistivity of the films was lowered (5.6 x 104(Omega) cm) at 200 degree(s)C for the 395-nm laser pulses, while maintaining the optical transparency. In addition, the deposition rate increased six times. Optical emission was measured to compare the plumes generated by 395-nm and 790-nm laser pulses. We found that the emission from ions was suppressed relative to neutral atoms. Also the kinetic energy of ejected species was nearly doubled for the 395-nm laser pulses.© (2000) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

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詳細情報 詳細情報について

  • CRID
    1873116917677266560
  • DOI
    10.1117/12.405719
  • ISSN
    0277786X
  • データソース種別
    • OpenAIRE

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