Aberration Corrected Microscopy and Spectroscopy for Pico-meter Characterization of Device Materials - Coductance Quantization of Metal Nanowire and AtomicChain - (Invited)

収録刊行物

• Extended Abstracts of the 2008 International Conference on Solid State Devices and Materials

  Extended Abstracts of the 2008 International Conference on Solid State Devices and Materials 2008-09-24

  The Japan Society of Applied Physics