Interference fringes observed in electron emission patterns of a multi-wall carbon nanotube
説明
Field electron emission patterns from a MWNT with clean surface exhibit fine structures originating from pentagons located at the tip end. The field emission microscopy (FEM) has resolved six pentagons each of which has a small dark spot in its center. Moreover, the bright streaks have been observed at the boundary regions between adjacent pentagons. By calculations based on the formula of Young's interference of two beams, Oshima et al. (2002) reported that the observed streaks are interference fringes. In this paper, we show experimental results to prove that the streaks are Young's interference fringes.
収録刊行物
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- IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479)
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IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) 55-56, 2004-03-01
Japan Soc. Promotion of Sci