An approach to reduce over-testing of path delay faults in data paths using RT-level information
Bibliographic Information
- Title
- An approach to reduce over-testing of path delay faults in data paths using RT-level information
- Author
- Yuki Yoshikawa, Satoshi Ohtake, Hideo Fujiwara
Journal
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- 11th IEEE European Test Symposium
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11th IEEE European Test Symposium 146-151, 2006
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Details 詳細情報について
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- CRID
- 1010000781949030662
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- Article Type
- journal article
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- Data Source
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- KAKEN