Grazing Incidence X-ray Diffraction Measurements of InAs/GaAs Quantum Dots Using Equipment Available for Laboratories
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- MUKAI Koki
- Yokohama National University
Bibliographic Information
- Title
- Grazing Incidence X-ray Diffraction Measurements of InAs/GaAs Quantum Dots Using Equipment Available for Laboratories
- Author
- Kohki Mukai
Journal
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- Journal of Nanoelectronics and Optoelectronics (投稿中)
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Journal of Nanoelectronics and Optoelectronics (投稿中) 2011
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Details 詳細情報について
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- CRID
- 1010000782040711040
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- Article Type
- journal article
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- Data Source
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- KAKEN