Grazing Incidence X-ray Diffraction Measurements of InAs/GaAs Quantum Dots Using Equipment Available for Laboratories
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- 向井 剛輝
- 横浜国立大学
書誌事項
- タイトル
- Grazing Incidence X-ray Diffraction Measurements of InAs/GaAs Quantum Dots Using Equipment Available for Laboratories
- 著者
- Kohki Mukai
収録刊行物
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- Journal of Nanoelectronics and Optoelectronics (投稿中)
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Journal of Nanoelectronics and Optoelectronics (投稿中) 2011