Characterization of Electronic Structure of Grain Boundaries in CIGSAbsorber Layers by Kelvin Probe Force Microscopy
Bibliographic Information
- Title
- Characterization of Electronic Structure of Grain Boundaries in CIGSAbsorber Layers by Kelvin Probe Force Microscopy
- Author
- T.Fukae, H.Ichiki, H.Kashiwabara, T.Shiota, A.Yamanda, S.Ishizuka, K.Matsubara, S.Niki, Y.Yoshimura, N.Terada
Journal
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- Proc.26th European Photovoltaic Sci.Engng.Conf.
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Proc.26th European Photovoltaic Sci.Engng.Conf. 3349-3352, 2010
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Details 詳細情報について
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- CRID
- 1010000782045213056
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- Article Type
- journal article
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- Data Source
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- KAKEN