Characterization of Electronic Structure of Grain Boundaries in CIGSAbsorber Layers by Kelvin Probe Force Microscopy
書誌事項
- タイトル
- Characterization of Electronic Structure of Grain Boundaries in CIGSAbsorber Layers by Kelvin Probe Force Microscopy
- 著者
- T.Fukae, H.Ichiki, H.Kashiwabara, T.Shiota, A.Yamanda, S.Ishizuka, K.Matsubara, S.Niki, Y.Yoshimura, N.Terada
収録刊行物
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- Proc.26th European Photovoltaic Sci.Engng.Conf.
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Proc.26th European Photovoltaic Sci.Engng.Conf. 3349-3352, 2010