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Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment
Bibliographic Information
- Title
- Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment
- Author
- Yoshinobu Higami, Hiroshi Takahashi, Shin-ya Kobayashi and Kewal K. Saluja
Journal
-
- IEICE Transactions on Information and Systems
-
IEICE Transactions on Information and Systems E96-D 1323-1331, 2013
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Details 詳細情報について
-
- CRID
- 1010000782247456769
-
- Article Type
- journal article
-
- Data Source
-
- KAKEN
