Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment
書誌事項
- タイトル
- Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment
- 著者
- Yoshinobu Higami, Hiroshi Takahashi, Shin-ya Kobayashi and Kewal K. Saluja
収録刊行物
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- IEICE Transactions on Information and Systems
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IEICE Transactions on Information and Systems E96-D 1323-1331, 2013