- 【Updated on May 12, 2025】 Integration of CiNii Dissertations and CiNii Books into CiNii Research
- Trial version of CiNii Research Automatic Translation feature is available on CiNii Labs
- Suspension and deletion of data provided by Nikkei BP
- Regarding the recording of “Research Data” and “Evidence Data”
Reliability of low temperature poly-Si Thin Film Transistors with ultrathin gate oxide
-
- YANO Hiroshi
- 奈良先端科学技術大学院大学
-
- YUKIHARU Uraoka
- Nara Institute of Science and Technology
Bibliographic Information
- Title
- Reliability of low temperature poly-Si Thin Film Transistors with ultrathin gate oxide
- Author
- Hitoshi Ueno, Yuta Sugawara, Hiroshi Yano, Tomoaki Hatayama, Yukiharu Uraoka, Takashi Fuyuki, Tadashi Serikawa
Journal
-
- pn. J. Appl. Phys. Vol.46,No.7A
-
pn. J. Appl. Phys. Vol.46,No.7A 2007
- Tweet
Details 詳細情報について
-
- CRID
- 1010000782440670866
-
- Article Type
- journal article
-
- Data Source
-
- KAKEN