Hot Carrier Degradation of SiGe/Si Heterointerface and Experimental Estimation of Density of Locally Generated Heterointerface Traps
書誌事項
- タイトル
- Hot Carrier Degradation of SiGe/Si Heterointerface and Experimental Estimation of Density of Locally Generated Heterointerface Traps
- 著者
- T.Tsuchiya、S.Mishima、M.Sakuraba, J.Murota
収録刊行物
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- Jpn.J.Appl.Phys. Vol.46、No.8A
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Jpn.J.Appl.Phys. Vol.46、No.8A 5015-5020, 2007