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Hot Carrier Degradation of SiGe/Si Heterointerface and Experimental Estimation of Density of Locally Generated Heterointerface Traps

Bibliographic Information

Title
Hot Carrier Degradation of SiGe/Si Heterointerface and Experimental Estimation of Density of Locally Generated Heterointerface Traps
Author
T.Tsuchiya、S.Mishima、M.Sakuraba, J.Murota

Journal

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Details

  • CRID
    1010000782461448592
  • Article Type
    journal article
  • Data Source
    • KAKEN

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