Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations
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- 佐藤 幸生
- 東京大学
Bibliographic Information
- Title
- Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations
- Author
- 佐藤 幸生, 他
Journal
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- Applied Physics Letters 84・26
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Applied Physics Letters 84・26 5311-5313, 2004
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Details 詳細情報について
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- CRID
- 1010282256583180684
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- Article Type
- journal article
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- Data Source
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- KAKEN
