Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations
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- 佐藤 幸生
- 東京大学
書誌事項
- タイトル
- Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations
収録刊行物
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- Applied Physics Letters 84・26
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Applied Physics Letters 84・26 5311-5313, 2004