Power-constrained test scheduling for RTL datapaths of non-scan BIST schemes
Bibliographic Information
- Title
- Power-constrained test scheduling for RTL datapaths of non-scan BIST schemes
- Author
- Z.You, K.Yamaguchi, M.Inoue, J.Savir, H.Fujiwara
Journal
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- Proceedings of the IEEE 13th Asian Test Symposium (ATS'04)
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Proceedings of the IEEE 13th Asian Test Symposium (ATS'04) 32-39, 2004
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Details 詳細情報について
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- CRID
- 1010282256769014528
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- Article Type
- journal article
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- Data Source
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- KAKEN