Power-constrained test scheduling for RTL datapaths of non-scan BIST schemes
書誌事項
- タイトル
- Power-constrained test scheduling for RTL datapaths of non-scan BIST schemes
- 著者
- Z.You, K.Yamaguchi, M.Inoue, J.Savir, H.Fujiwara
収録刊行物
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- Proceedings of the IEEE 13th Asian Test Symposium (ATS'04)
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Proceedings of the IEEE 13th Asian Test Symposium (ATS'04) 32-39, 2004