Building highly transferable interatomic models for atomistic simulation of device reliability
Bibliographic Information
- Title
- Building highly transferable interatomic models for atomistic simulation of device reliability
- Author
- Yoshitaka Umeno and Atsushi Kubo
Journal
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- SGEM Conference Proceedings
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SGEM Conference Proceedings III-6 19-26, 2017
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Details 詳細情報について
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- CRID
- 1010282256897133570
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- Article Type
- journal article
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- Data Source
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- KAKEN