A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint
Bibliographic Information
- Title
- A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint
- Author
- Ryoichi Inoue
Journal
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- IEICE Transactions on Information and Systems E93-D
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IEICE Transactions on Information and Systems E93-D 24-32, 2009
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Details 詳細情報について
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- CRID
- 1010282257008276357
-
- Article Type
- journal article
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- Data Source
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- KAKEN