A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint
書誌事項
- タイトル
- A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint
- 著者
- Ryoichi Inoue
収録刊行物
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- IEICE Transactions on Information and Systems E93-D
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IEICE Transactions on Information and Systems E93-D 24-32, 2009