Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization

Bibliographic Information

Title
Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization
Author
K. Hirata, Y. Saitoh, A. Chiba, K. Yamada,and K. Narumi

Journal

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Details 詳細情報について

  • CRID
    1010282257065369088
  • Article Type
    journal article
  • Data Source
    • KAKEN

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