Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization
Bibliographic Information
- Title
- Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization
- Author
- K. Hirata, Y. Saitoh, A. Chiba, K. Yamada,and K. Narumi
Journal
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- Nucl. Instr. and Meth. in Phys. Res. B
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Nucl. Instr. and Meth. in Phys. Res. B
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Details 詳細情報について
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- CRID
- 1010282257065369088
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- Article Type
- journal article
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- Data Source
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- KAKEN