[Updated on Apr. 18] Integration of CiNii Articles into CiNii Research

Review of the applications of x-ray refraction and the x-ray waveguide phenomenon to estimation of film structure

Bibliographic Information

Title
Review of the applications of x-ray refraction and the x-ray waveguide phenomenon to estimation of film structure
Author
K.Hayashi

Journal

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Details

  • CRID
    1010282257066221575
  • Article Type
    journal article
  • Data Source
    • KAKEN

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