- 【Updated on May 12, 2025】 Integration of CiNii Dissertations and CiNii Books into CiNii Research
- Trial version of CiNii Research Automatic Translation feature is available on CiNii Labs
- Suspension and deletion of data provided by Nikkei BP
- Regarding the recording of “Research Data” and “Evidence Data”
Review of the applications of x-ray refraction and the x-ray waveguide phenomenon to estimation of film structure
Bibliographic Information
- Title
- Review of the applications of x-ray refraction and the x-ray waveguide phenomenon to estimation of film structure
- Author
- K.Hayashi
Journal
-
- Journal of Physics:Condensed Matter
-
Journal of Physics:Condensed Matter 22 474006-, 2010
- Tweet
Details 詳細情報について
-
- CRID
- 1010282257066221575
-
- Article Type
- journal article
-
- Data Source
-
- KAKEN
