Review of the applications of x-ray refraction and the x-ray waveguide phenomenon to estimation of film structure
Bibliographic Information
- Title
- Review of the applications of x-ray refraction and the x-ray waveguide phenomenon to estimation of film structure
- Author
- K.Hayashi
Journal
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- Journal of Physics:Condensed Matter
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Journal of Physics:Condensed Matter 22 474006-, 2010
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Details 詳細情報について
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- CRID
- 1010282257066221575
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- Article Type
- journal article
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- Data Source
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- KAKEN