Review of the applications of x-ray refraction and the x-ray waveguide phenomenon to estimation of film structure
書誌事項
- タイトル
- Review of the applications of x-ray refraction and the x-ray waveguide phenomenon to estimation of film structure
- 著者
- K.Hayashi
収録刊行物
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- Journal of Physics:Condensed Matter
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Journal of Physics:Condensed Matter 22 474006-, 2010
