Power-constrained testing of VLSI circuits

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Bibliographic Information

Title
"Power-constrained testing of VLSI circuits"
Statement of Responsibility
by Nicola Nicolici and Bashir M. Al-Hashimi
Publisher
  • Kluwer Academic
Publication Year
  • c2003
Book size
25 cm

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Notes

Includes bibliographical references(p. 163- 173) and index

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