Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom]
書誌事項
- タイトル
- "Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom]"
- 責任表示
- edited by Brian K. Tanner and D. Keith Bowen
- 出版者
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- Plenum Press
- 出版年月
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- c1980
- 書籍サイズ
- 26 cm
この図書・雑誌をさがす
注記
"Published in cooperation with NATO Scientific Affairs Division."
Includes bibliographical references and index
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詳細情報 詳細情報について
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- CRID
- 1130000795054485376
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- NII書誌ID
- BA03216360
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- ISBN
- 0306406284
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- LCCN
- 80026509
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- Web Site
- https://lccn.loc.gov/80026509
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- 本文言語コード
- en
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- 出版国コード
- us
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- タイトル言語コード
- en
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- 出版地
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- New York, N.Y.
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- データソース種別
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- CiNii Books