Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California
Bibliographic Information
- Title
- "Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California"
- Statement of Responsibility
- cosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors
- Publisher
-
- SPIE--the International Society for Optical Engineering
- Publication Year
-
- c1985
- Book size
- 28 cm
- Series Name / No
-
- pbk.
Search this Book/Journal
Notes
Includes bibliographies and index
- Tweet
Details 詳細情報について
-
- CRID
- 1130000796260069504
-
- NII Book ID
- BA23996502
-
- ISBN
- 0892525606
-
- LCCN
- 85050425
-
- Web Site
- https://lccn.loc.gov/85050425
-
- Text Lang
- en
-
- Country Code
- us
-
- Title Language Code
- en
-
- Place of Publication
-
- Bellingham, Wash., USA
-
- Subject
-
- Data Source
-
- CiNii Books