Testability concepts for digital ICs : the macro test approach

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Bibliographic Information

Title
"Testability concepts for digital ICs : the macro test approach"
Statement of Responsibility
by F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen
Publisher
  • Kluwer Academic Publishers
Publication Year
  • c1995
Book size
25 cm
Series Name / No
  • : hard : alk. paper

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Notes

Includes bibliographical references (p. 197-205)

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