Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects

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書誌事項

タイトル
"Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects"
責任表示
edited by H.J. Queisser ... [et al.] ; [sponsored by] the Electrochemical Society. Electronics and Dielectric Science and Technology Divisions
出版者
  • The Electrochemical Society
出版年月
  • c1994
書籍サイズ
23 cm

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注記

Includes bibliographies and index

"held October 11-13, 1993 at the Sheraton New Orleans Hotel in New Orleans, LA"

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詳細情報 詳細情報について

  • CRID
    1130000797643492608
  • NII書誌ID
    BA23030106
  • ISBN
    1566770378
  • LCCN
    93072866
  • Web Site
    https://lccn.loc.gov/93072866
  • 本文言語コード
    en
  • 出版国コード
    us
  • タイトル言語コード
    en
  • 出版地
    • Pennington, NJ
  • データソース種別
    • CiNii Books
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