Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts

Name: Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts
Author: Hicks, John, De Forest, Peter R., Baylor, Vivian M., United States. National Institute of Standards and Technology, National Institute of Justice (U.S.), Society of Photo-optical Instrumentation Engineers

Hicks, John, De Forest, Peter R., Baylor, Vivian M., United States. National Institute of Standards and Technology, National Institute of Justice (U.S.), Society of Photo-optical Instrumentation Engineers

Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts

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Hicks, John
De Forest, Peter R.
Baylor, Vivian M.
United States. National Institute of Standards and Technology
National Institute of Justice (U.S.)
Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Title: "Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts"

Statement of Responsibility: John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.]

Publisher

SPIE

Publication Year

c1997

Book size: 28 cm

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Includes bibliographic references and author index

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