Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts

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書誌事項

タイトル
"Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts"
責任表示
John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.]
出版者
  • SPIE
出版年月
  • c1997
書籍サイズ
28 cm

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注記

Includes bibliographic references and author index

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