Spectroscopic characterization techniques for semiconductor technology : 9-10 November 1983, Cambridge, Massachusetts

Web Site CiNii Available at 2 libraries

Bibliographic Information

Title
"Spectroscopic characterization techniques for semiconductor technology : 9-10 November 1983, Cambridge, Massachusetts"
Statement of Responsibility
Fred H. Pollak, Robert S. Bauer, chairmen/editors
Publisher
  • SPIE -- the International Society for Optical Engineering
Publication Year
  • c1984
Book size
28 cm

Search this Book/Journal

Related Books

See more

Details 詳細情報について

  • CRID
    1130282271119977472
  • NII Book ID
    BA23978941
  • ISBN
    0892524871
  • LCCN
    83051560
  • Web Site
    https://lccn.loc.gov/83051560
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Bellingham, Wash.
  • Data Source
    • CiNii Books
Back to top