Evaluation of advanced semiconductor materials by electron microscopy

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書誌事項

タイトル
"Evaluation of advanced semiconductor materials by electron microscopy"
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edited by David Cherns
出版者
  • Plenum Press
出版年月
  • c1989
書籍サイズ
27 cm

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注記

"Proceedings of a NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy, held September 12-17, 1988, in Bristol, United Kingdom"--Verso t.p

"Held within the program of activities of the NATO Special Program on Condensed Systems of Low Dimensionality, running from 1983 to 1988 as part of the activities of the NATO Science Committee"--P

"Published in cooperation with NATO Scientific Affairs Division."

Includes bibliographical references and index

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