Evaluation of advanced semiconductor materials by electron microscopy
Bibliographic Information
- Title
- "Evaluation of advanced semiconductor materials by electron microscopy"
- Statement of Responsibility
- edited by David Cherns
- Publisher
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- Plenum Press
- Publication Year
-
- c1989
- Book size
- 27 cm
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Notes
"Proceedings of a NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy, held September 12-17, 1988, in Bristol, United Kingdom"--Verso t.p
"Held within the program of activities of the NATO Special Program on Condensed Systems of Low Dimensionality, running from 1983 to 1988 as part of the activities of the NATO Science Committee"--P
"Published in cooperation with NATO Scientific Affairs Division."
Includes bibliographical references and index
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Details 詳細情報について
-
- CRID
- 1130282271311520640
-
- NII Book ID
- BA08059780
-
- ISBN
- 0306433621
-
- LCCN
- 89016354
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- Web Site
- https://lccn.loc.gov/89016354
-
- Text Lang
- en
-
- Country Code
- us
-
- Title Language Code
- en
-
- Place of Publication
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- New York
-
- Classification
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- LCC: QC611.6.S9
- DC20: 530.4/1
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- Data Source
-
- CiNii Books
