書誌事項
- タイトル
- "Evaluation of advanced semiconductor materials by electron microscopy"
- 責任表示
- edited by David Cherns
- 出版者
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- Plenum Press
- 出版年月
-
- c1989
- 書籍サイズ
- 27 cm
この図書・雑誌をさがす
注記
"Proceedings of a NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy, held September 12-17, 1988, in Bristol, United Kingdom"--Verso t.p
"Held within the program of activities of the NATO Special Program on Condensed Systems of Low Dimensionality, running from 1983 to 1988 as part of the activities of the NATO Science Committee"--P
"Published in cooperation with NATO Scientific Affairs Division."
Includes bibliographical references and index
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詳細情報 詳細情報について
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- CRID
- 1130282271311520640
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- NII書誌ID
- BA08059780
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- ISBN
- 0306433621
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- LCCN
- 89016354
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- Web Site
- https://lccn.loc.gov/89016354
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- 本文言語コード
- en
-
- 出版国コード
- us
-
- タイトル言語コード
- en
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- 出版地
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- New York
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- 分類
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- LCC: QC611.6.S9
- DC20: 530.4/1
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- データソース種別
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- CiNii Books
