Electron-beam, X-ray, and ion-beam techniques for submicrometer lithographies IV : March 14-15, 1985, Santa Clara, California
Bibliographic Information
- Title
- "Electron-beam, X-ray, and ion-beam techniques for submicrometer lithographies IV : March 14-15, 1985, Santa Clara, California"
- Statement of Responsibility
- Philliip D. Blais, chairman/editor ; cooperating organization, the International Society for Hybrid Microelectronics
- Publisher
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- SPIE--the International Society for Optical Engineering
- Publication Year
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- c1985
- Book size
- 28 cm
- Series Name / No
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- pbk.
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Notes
Includes bibliographies and index
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Details 詳細情報について
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- CRID
- 1130282272731864320
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- NII Book ID
- BA00226980
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- ISBN
- 089252572X
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- LCCN
- 85061233
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- Web Site
- https://lccn.loc.gov/85061233
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Bellingham, Wash., USA
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- Classification
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- LCC: TK7874
- DC19: 621.3815/2
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- Subject
-
- Data Source
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- CiNii Books