A random matrix approach to detect defects in a strongly scattering polycrystal: How the memory effect can help overcome multiple scattering
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- S. Shahjahan
- 1EDF R&D, Materials and Mechanics of Components Department, EDF Lab Les Renardières, 77818 Moret sur Loing, France
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- A. Aubry
- Université Paris Diderot-Paris 7 2 Institut Langevin, ESPCI ParisTech, CNRS, , 1 rue Jussieu, 75005 Paris, France
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- F. Rupin
- 1EDF R&D, Materials and Mechanics of Components Department, EDF Lab Les Renardières, 77818 Moret sur Loing, France
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- B. Chassignole
- 1EDF R&D, Materials and Mechanics of Components Department, EDF Lab Les Renardières, 77818 Moret sur Loing, France
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- A. Derode
- Université Paris Diderot-Paris 7 2 Institut Langevin, ESPCI ParisTech, CNRS, , 1 rue Jussieu, 75005 Paris, France
書誌事項
- 公開日
- 2014-06-09
- DOI
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- 10.1063/1.4882421
- 公開者
- AIP Publishing
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説明
<jats:p>We report on ultrasonic imaging in a random heterogeneous medium. The goal is to detect flaws embedded deeply into a polycrystalline material. A 64-element array of piezoelectric transmitters/receivers at a central frequency of 5 MHz is used to capture the Green's matrix in a backscattering configuration. Because of multiple scattering, conventional imaging completely fails to detect the deepest flaws. We utilize a random matrix approach, taking advantage of the deterministic coherence of the backscattered wave-field which is characteristic of single scattering and related to the memory effect. This allows us to separate single and multiple scattering contributions. As a consequence, we show that flaws are detected beyond the conventional limit, as if multiple scattering had been overcome.</jats:p>
収録刊行物
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- Applied Physics Letters
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Applied Physics Letters 104 (23), 2014-06-09
AIP Publishing
