An All-Digital Unified Physically Unclonable Function and True Random Number Generator Featuring Self-Calibrating Hierarchical Von Neumann Extraction in 14-nm Tri-gate CMOS
収録刊行物
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- IEEE Journal of Solid-State Circuits
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IEEE Journal of Solid-State Circuits 54 (4), 1074-1085, 2019-04
Institute of Electrical and Electronics Engineers (IEEE)
