Strain mapping at the interface of InP/In<i> _x </i>Ga_1-<i>x</i>As/InP as measured by the scanning transmission electron microscope-moiré fringe method

Details 詳細情報について

• CRID

  1360566399836761216

• NII Article ID

  210000157167

• DOI

  10.7567/1882-0786/ab4604

• ISSN

  18820786

  18820778

• Web Site

  http://iopscience.iop.org/article/10.7567/1882-0786/ab4604

  http://iopscience.iop.org/article/10.7567/1882-0786/ab4604/pdf

  https://iopscience.iop.org/article/10.7567/1882-0786/ab4604/pdf

  https://iopscience.iop.org/article/10.7567/1882-0786/ab4604

• Data Source

  • Crossref
  • CiNii Articles
  • KAKEN