Cosmic ray induced failures in high power semiconductor devices

DOI Web Site Web Site 1 Citations

H.R. Zeller

Journal

Microelectronics Reliability

Microelectronics Reliability 37 (10-11), 1711-1718, 1997-10

Elsevier BV

Citations (1)*help

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Details 詳細情報について

CRID

1361137046399050624
DOI

10.1016/s0026-2714(97)00146-7
ISSN

00262714
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https://api.elsevier.com/content/article/PII:S0026271497001467?httpAccept=text/xml

https://api.elsevier.com/content/article/PII:S0026271497001467?httpAccept=text/plain
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