Multifrequency continuous wave terahertz spectroscopy for absolute thickness determination
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- Maik Scheller
- Technische Universität Braunschweig 1 Institut für Hochfrequenztechnik, , Schleinitzstr. 22, 38106 Braunschweig, Germany
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- Kai Baaske
- Technische Universität Braunschweig 1 Institut für Hochfrequenztechnik, , Schleinitzstr. 22, 38106 Braunschweig, Germany
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- Martin Koch
- Philipps-Universität Marburg 2 Fachbereich Physik, , Renthof 5, 35032 Marburg, Germany
説明
<jats:p>We present a tunable multifrequency continuous wave terahertz spectrometer based on two laser diodes, photoconductive antennas, and a coherent detection scheme. The system is employed to determine the absolute thickness of samples utilizing a proposed synthetic difference frequency method to circumvent the 2π uncertainty known from conventional photomixing systems while preserving a high spatial resolution.</jats:p>
収録刊行物
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- Applied Physics Letters
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Applied Physics Letters 96 (15), 151112-, 2010-04-12
AIP Publishing