Analytical inversion of photothermal measurements: Independent determination of the thermal conductivity and diffusivity of a conductive layer deposited on an insulating substrate

Christian Frétigny, Jean Paul Roger, Valérie Reita, Danièle Fournier

doi:10.1063/1.2818102

Analytical inversion of photothermal measurements: Independent determination of the thermal conductivity and diffusivity of a conductive layer deposited on an insulating substrate

DOI PDF 被引用文献1件

Christian Frétigny

UMR 7615 CNRS/UPMC Laboratoire PPMD, , ESPCI 10 rue Vauquelin 75231 Paris Cedex 5, France and Laboratoire PEM, , ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France
Jean Paul Roger

UMR 7615 CNRS/UPMC Laboratoire PPMD, , ESPCI 10 rue Vauquelin 75231 Paris Cedex 5, France and Laboratoire PEM, , ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France
Valérie Reita

UMR 7615 CNRS/UPMC Laboratoire PPMD, , ESPCI 10 rue Vauquelin 75231 Paris Cedex 5, France and Laboratoire PEM, , ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France
Danièle Fournier

UMR 7615 CNRS/UPMC Laboratoire PPMD, , ESPCI 10 rue Vauquelin 75231 Paris Cedex 5, France and Laboratoire PEM, , ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France

書誌事項

公開日: 2007-12-01

DOI

10.1063/1.2818102

公開者: AIP Publishing

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説明

<jats:p>The long distance behavior of the surface temperature wave in a thermoreflectance microscopy experiment is established for a conductive layer deposited on an insulating substrate. At large distance from the point source, heat is confined, so the amplitude decrease is lower than for a bulk sample. From the slopes which appear on the phase and on the log scale amplitude, a procedure is proposed to extract, separately, the thermal diffusivity and conductivity of the layer, taking into account data obtained at different modulation frequencies. Experimental results are presented which confirm the validity of the method.</jats:p>